Alexandre Anguelouch

Alexandre Anguelouch is an experienced professional in the field of systems engineering and metrology, currently serving as Senior Manager, Systems Engineering at Onto Innovation since October 2019, focusing on advanced-node Ellipsometry Metrology tooling. Prior roles include Optical Systems Characterization Engineer at Nanometrics and Metrology Engineer at Hitachi Global Storage Technologies, where responsibilities encompassed metrology support for thin film head product lines, development of 3D metrology solutions, and project management for optical and electron microscopy methods. Alexandre also held a Metrology Engineer position at Western Digital, providing extensive support for magnetic head product lines, and worked as a Postdoctoral Fellow at Johns Hopkins University. Educational qualifications include a Ph.D. in Physics from Brown University and a B.S. in Physics from the Moscow Institute of Physics and Technology.